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Category : Measurements of C-V / I-V by NEEDLE PROBING
  1 Product(s) found(s)
 Prober + temperature test + Keithley 4200+ d'infos..
The configuration includes a probe station, a powerfull characterization system the K4200 and optional accessories (thermal chuck, dark box...)
» Will allow the characterization of the main components and materials (diode, transistor, photocell, high K...) with up to 8 chanels I/V, C/V and pulses
» The software operates thru windows allowing DDE, multi-tasking...
» Voltages ranges 1µv to 210V, current 0.1fA to 1A, libraries include HCI, CHC, Hall effect, Van Der Pauw...The CVU option includes also C-V, C-T and C-F
» Frequency range 10KHz to 10 MHz, capa range 1fF to 100nF
» The configuration is modular and can include : Thermally controlled chuck, illumination during measurements (photocell, CMOs cameras...), total isolation of the light with the dark box...
» Please consult with your application
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