Fine pitch cantilever probecards

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The cantilever probecards manufactured by Probelogic fullfill all production probing applications and particularly the highly demanding nowadays circuits : High pincount, ultra-fine pitch, multi-DUT testing, specific constraint (low-k, probe over active area...) » Pcb design available for custom boards (all commercial testers) » All services of specific design, manufacture, diagnostic and repair, alignment... » Available for pads test or bumps tests » Consult MW for your specific application

Cantilever probecards for low-leakage parametric testing

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Cantilever card for parametric tests (Agilent, Keithley...), very low leakage » P-Probe provides test capabilities solutions to as low as 1 picoA » F-Probe provides test capabilities solutions to as low as 1 femtoA

Specific RF tests probecards

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The RF probecards allow a frequency testing up to 3GHZ (around), they can combien standard input/output and RF access » The pcb is custom designed if needed or customer supplied » Needels can be of various materials, shapes, sharpness...Depending on the application » Tests on bumps is possible with using flat needles

Vertical technology probecards

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The vertical probecards technologies are used in a number of cases where sometimes the cantilever techno does no longer respond » The applications are : C4, BGA, flip-chip (flat tip) and memories, micro-controllers, multi-DUT... » Probelogic has developped a unique approach leading to a superior contact quality and a unform contact force » Available for pads test or bumps tests