WL1160 : Economical manual RF probe station

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The WL1160 offers an economical while professional prober for RF & Microwave probing applications, available for single die or wafer up to 8" » Stable platen and specific anti-resonant construction » Individual chuck for RF needles & cables calibration » Quick platen lift and fine Z adjustment »: Accepts RF positioners and DC simultaneously » High-power microscope (multi-objectives) or stereozoom binocular (Tilt-back clearing option) » Accessories & Options : Thermal chuck, probecards use, triax chuck for fA measurement, dark box for anti-radiation & Light measurements, anti-vibration table... » See the DC version

Models

WL1160B6N : RF manual station for wafer up to 6"

WL1160B8N : RF manual station for wafer up to 8"

WL170 : Economical manual and high stability probe station

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The WL170 is a combination of the submicronic model WL210 and the economical S1160 filling the gapt between these 2 extremes » the base platen is derived from the CM210 assuring a high stability, can receive up to 10 positioners » The X and Y motions are very precise » The model includes the quick platen lift by handle and the fine Z adjustment by a rotating knob » The microscope can be a high-power (multi-objectives) or a binocular stereoozoom » Choice of options : thermal chuck, probecards use, triax chuck for fA probing...

Models

WL170 : RF manual prober up to 8"

WL210/310 : RF manual "Wavelink" submicronic prober

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Microwave analytical wafer probing for accurate S-Parameter, load-pull, 1/f, noise-figure measurements and many others » The WL serie is the platform of choice with thermal, shielded and local-enclosure options available » Superior low-noise electrical performance & Stable, flexible, and field-upgradeable » While RF pad sizes are generous, high frequency mandates that probe placement do not introduce parasitic errors which can effect yield » Semi-automatic version available » Based on our proven CHECKMATE stations, with independent theta for wafer and cal chucks eliminates wafer realignment after calibration & Independent Z for wafer and cal chucks

Models

WL210 : Manual Rf & Microwave prober up to 8"

WL310 : Manual Rf & Microwave prober up to 12"

WL250/350 : RF semi-automatic "Wavelink" prober

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Upper limit in computer-controlled analytical wafer probing for accurate S-Parameter, load-pull, 1/f, noise-figure measurements and many others » Wether you need EMI or RFI isolation or frost-free at -55°C, the WL250 serie is the platform of choice, thermal, shielded and local-enclosure options available, superior low-noise electrical performance, stable, flexible, and field-upgradeable » Based on our proven CheckMate mechanics, independent theta for wafer and cal chucks (2 or 3) eliminates wafer realignment after calibration » Independent Z for wafer and cal chucks Improves test and cal contact consistency » Locking platen height adjustment (2” range) reduces the chance of accidental probe damage » Massive steel platen to minimize resonance » non-resonant to over 350GHz » See the DC range

Models

WL250 : RF semi-auto prober 8"

WL350 : RF semi-auto prober 12"