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1 - ELECTRICAL CHARACTERIZATION OF SEMICONDUCTIVE LAYERS
NEW
: SOLAR CELLS CHARACTERIZATION
A - CHARACTERIZATION BY C-V / I-V
Measurements of C-V / I-V by NEEDLE PROBING
MERCURY PROBE C-V characterization Equipment
Options & Accessories / C-V characterization
B - RESISTIVITY MEASUREMENT BY 4-POINT PROBE METHOD
Sheet resistivity 4 POINT-PROBE-SYSTEMS semiconductors range
Spécial for USJ junctions leakage measurements
Configuration :
Hand-held
resistivity measurement
Configuration :
High resistivity
measurement
Configuration : Very
low resistivity
measurement
MERCURY CONTACT Four-Point Probe
4-POINT-PROBE-HEAD for resistivity measurement
Micropositioner specific for 4 point probe head
Options & Accessories / Resistivity measurements
C - CHARACTERIZATION BY HALL EFFECT
Hall effect & Other parameters measurement Equipment
Options & Accessories / Hall effect characterization
2 - WAFER BACKGRINDING & BACKTHINNING
A - BACKTHINNING OF INDIVIDUAL DIES (Service)
B - ADHESIVE TAPE FOR BACKGRINDING
C - UV CURING SYSTEMS
D - WAFER BACKLAPPING FILM APPLICATION & REMOVAL
Wafer backlapping film laminators & Removal
Options & Accessories for wafer backgrinding lamination & Removal
3 - VISUAL INSPECTION & OPTICS
A - Microscopes & Binocular
B - Objectives and eyepieces
C - Accessories
Cameras
4 - PROBING OF MICROSTRUCTURES
A - PROBERS FOR ELECTRICAL ANALYSIS AND CHARACTERIZATION
General purpose probers
(design, failure analysis, small production...)
RF & MICROWAVE
(and specific MEMs...) probers
B - ACCESSORIES FOR PROBING APPLICATIONS
Microscopes
Anti-vibration tables
Precision micropositioners
Microtools (MEMs testing, biological...)
Probe holders
Probe needles
Specific probes (active-Coaxial-Kelvin...)
Thermal chucks - Temperature testing
Lasers for removing metal and layers
Miscellaneous other accessories
Vacuum pump & compressor
Specific
accessories for RF & Microwave
applications
Specific RF positioner
RF-Microwave probes
RF & microwave cables
C - HIGH DENSITY CANTILEVER & VERTICAL PROBECARDS
D - CLEANING SHEETS FOR PROBECARDS ONLINE CLEANING
5 - DICING OF SILICON AND OTHER SUBSTRATES
A -
DICING MACHINE
B - ADHESIVE TAPES FOR WAFERS & SUBSTRATES
Standard adhesive tapes
UV adhesive film
C - WAFER/FRAME FILM LAMINATION
Wafer/Frame film mounters
Options & Accessories
D - DIAMOND DICING WHEELS FOR ALL THIN MATERIALS
Hubless type used with mounting flanges
Hubtype blade ready to use
E - ULTRAVIOLET FILM IRRADIATORS
UV curing equipment
Manual UV lamps
Options & Acessories
F - FILM EXPANSION AFTER DICING
G - CLEANING & BRUSHING AFTER DICING
H - ACCESSORIES RELATED TO DICING
Plastic rings & Metal frames
Mounting flanges for Hubless blades
Other accessories related to dicing
6 - TESTS OF FINISHED COMPONENTS & BURN IN
A1 - SOCKETS
NEWS
A2 - STANDARD SOCKETS FOR BURN IN AND TESTS
BGA/CSP, LGA Packages
QFN packages
Specific sockets for high dissipation devices
Sockets Axial-Radial & MELF packages
Sockets for TO, SIP, DIP packages
LCC, FlatPack, SMD, Microwave & Hybrids
ZigZag sockets & Staggered
Sockets for PLCC/SOJ & "Gull Wing" packages
Optical transceiver sockets & PGA
Connectors
B - BURN IN BOARDS - HUMIDITY & HAST BOARDS
C - SPRING TEST PROBES (POGO PINS)
D - TESTS INTERFACE BOARDS
E - INSTRUMENTS & SOFTWARES
7 - COMPONENT HANDLING & PACKAGING MATERIALS
Microhandling & Micro-tools
8 - SUBCONTRACT SERVICES PROTOTYPES
Category :
Hall effect & Other parameters measurement Equipment
3
Product(s) found(s)
HMS3000 : Hall effect & Other parameters measurement systems
+ d'infos..
The HMS3000 measures parameters of Van Der Pauw law: Resistivity, mobility, carrier concentration, Hall effect ...
with constant current source and permanent magnets
» The system provides
a low-cost access to the true characterization of semiconductors layers, compounds, solar cells...
, Used also in schools and universities to understand the materials parameters.
» The HMS3000 includes the software with I-V curves capability and can measure at
ambient temperature
or at 77K (
LN2 temp.
)
» The
new sample holder by spring needles
is easy and fast
» Different permanent magnets are available
++
See other models
++ Theory & Complements see
www.hall-effect.eu
Models
HMS3000
: Manual Hall effect & I-V curves measurements system, permanent magnet
HMS3500 : Variable temperature set for HMS3000
+ d'infos..
The
HMS3000
model can measure at ambient temperature
OR>
at 77K (LN2 temperature). The HMS3500 comes as a complement for the users of HMS3000. It will add the capability of variable temperature from 80K to 350K with a resolution of +-0.5°C.
» The Hall effect measurement within a variable temperature range is a very good indicator of performance for
solar cells
and
photovoltaic materials
++
See all models
++ Theory & Complements see
www.hall-effect.eu
HMS5000 : Variable temperature Hall effect measurement system
+ d'infos..
The HMS5000 is
the last released
and represents the outcome of
several years of research
aiming to propose a Hall effect measurement system with following features :
» Compact and easy to use, adapted to laboratories and small production
» Able to characterize a variety of semiconductor layers
» At
a Competitive price
for a system that offers
the temperature variation during measurement
» This feature is very appreciated when measuring certain devices (sensors,
solar cells and photovoltaic materials
...)
++
See other models of the range
++ Theory & Complements at
www.hall-effect.eu
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