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1 - ELECTRICAL CHARACTERIZATION OF SEMICONDUCTIVE LAYERS
NEW
: SOLAR CELLS CHARACTERIZATION
A - CHARACTERIZATION BY C-V / I-V
Measurements of C-V / I-V by NEEDLE PROBING
MERCURY PROBE C-V characterization Equipment
Options & Accessories / C-V characterization
B - RESISTIVITY MEASUREMENT BY 4-POINT PROBE METHOD
Sheet resistivity 4 POINT-PROBE-SYSTEMS semiconductors range
Spécial for USJ junctions leakage measurements
Configuration :
Hand-held
resistivity measurement
Configuration :
High resistivity
measurement
Configuration : Very
low resistivity
measurement
MERCURY CONTACT Four-Point Probe
4-POINT-PROBE-HEAD for resistivity measurement
Micropositioner specific for 4 point probe head
Options & Accessories / Resistivity measurements
C - CHARACTERIZATION BY HALL EFFECT
Hall effect & Other parameters measurement Equipment
Options & Accessories / Hall effect characterization
2 - WAFER BACKGRINDING & BACKTHINNING
A - BACKTHINNING OF INDIVIDUAL DIES (Service)
B - ADHESIVE TAPE FOR BACKGRINDING
C - UV CURING SYSTEMS
D - WAFER BACKLAPPING FILM APPLICATION & REMOVAL
Wafer backlapping film laminators & Removal
Options & Accessories for wafer backgrinding lamination & Removal
3 - VISUAL INSPECTION & OPTICS
A - Microscopes & Binocular
B - Objectives and eyepieces
C - Accessories
Cameras
4 - PROBING OF MICROSTRUCTURES
A - PROBERS FOR ELECTRICAL ANALYSIS AND CHARACTERIZATION
General purpose probers
(design, failure analysis, small production...)
RF & MICROWAVE
(and specific MEMs...) probers
B - ACCESSORIES FOR PROBING APPLICATIONS
Microscopes
Anti-vibration tables
Precision micropositioners
Microtools (MEMs testing, biological...)
Probe holders
Probe needles
Specific probes (active-Coaxial-Kelvin...)
Thermal chucks - Temperature testing
Lasers for removing metal and layers
Miscellaneous other accessories
Vacuum pump & compressor
Specific
accessories for RF & Microwave
applications
Specific RF positioner
RF-Microwave probes
RF & microwave cables
C - HIGH DENSITY CANTILEVER & VERTICAL PROBECARDS
D - CLEANING SHEETS FOR PROBECARDS ONLINE CLEANING
5 - DICING OF SILICON AND OTHER SUBSTRATES
A -
DICING MACHINE
B - ADHESIVE TAPES FOR WAFERS & SUBSTRATES
Standard adhesive tapes
UV adhesive film
C - WAFER/FRAME FILM LAMINATION
Wafer/Frame film mounters
Options & Accessories
D - DIAMOND DICING WHEELS FOR ALL THIN MATERIALS
Hubless type used with mounting flanges
Hubtype blade ready to use
E - ULTRAVIOLET FILM IRRADIATORS
UV curing equipment
Manual UV lamps
Options & Acessories
F - FILM EXPANSION AFTER DICING
G - CLEANING & BRUSHING AFTER DICING
H - ACCESSORIES RELATED TO DICING
Plastic rings & Metal frames
Mounting flanges for Hubless blades
Other accessories related to dicing
6 - TESTS OF FINISHED COMPONENTS & BURN IN
A1 - SOCKETS
NEWS
A2 - STANDARD SOCKETS FOR BURN IN AND TESTS
BGA/CSP, LGA Packages
QFN packages
Specific sockets for high dissipation devices
Sockets Axial-Radial & MELF packages
Sockets for TO, SIP, DIP packages
LCC, FlatPack, SMD, Microwave & Hybrids
ZigZag sockets & Staggered
Sockets for PLCC/SOJ & "Gull Wing" packages
Optical transceiver sockets & PGA
Connectors
B - BURN IN BOARDS - HUMIDITY & HAST BOARDS
C - SPRING TEST PROBES (POGO PINS)
D - TESTS INTERFACE BOARDS
E - INSTRUMENTS & SOFTWARES
7 - COMPONENT HANDLING & PACKAGING MATERIALS
Microhandling & Micro-tools
8 - SUBCONTRACT SERVICES PROTOTYPES
Category :
8 - SUBCONTRACT SERVICES PROTOTYPES
3
Product(s) found(s)
Packaging of individual dies
+ d'infos..
The packaging service is purposely
for small quantities of prototypes (5 to 10 pieces max)
» The typical applications is characterization on a packaged device instead of a single die in a final use environment
» The pakaging includes the die bonding into the package cavity, the wire bonding with gold or alu wires
» Optionally
chip on board
can be realized
Wafers & Thin substrates dicing
+ d'infos..
Dicing of thin materials by specific diamond coated dicing wheels
» Available for semiconductors
wafers and materials up to 200mm diameter
» III-V and exotic materials
»
Glass and ceramic dicing
up to 120mm square and 2mm thick
» Specific dicing work please consult
Individual die backthinning
+ d'infos..
The operation consists of
thinning the die from the backside
using specific diamond coated grinding wheels
» The typical applications are failures analysis or SEM inspection
» The backthinning is possible
down to 150µm
S
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