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HMS3000 : Hall effect & Other parameters measurement systems
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1 - ELECTRICAL CHARACTERIZATION OF SEMICONDUCTIVE LAYERS > C - CHARACTERIZATION BY HALL EFFECT > Hall effect & Other parameters measurement Equipment
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The HMS3000 measures parameters of Van Der Pauw law: Resistivity, mobility, carrier concentration, Hall effect ... with constant current source and permanent magnets
» The system provides a low-cost access to the true characterization of semiconductors layers, compounds, solar cells..., Used also in schools and universities to understand the materials parameters.
» The HMS3000 includes the software with I-V curves capability and can measure at ambient temperature or at 77K (LN2 temp.)
» The new sample holder by spring needles is easy and fast
» Different permanent magnets are available
++ See other models
++ Theory & Complements see www.hall-effect.eu
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See all Product Models by clicking the corresponding tab.
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| | Technical information | | Magnet | 0.37T, 0.55T, 1T |
| Temperature range (°C) | Ambient or LN2 (except 1T) |
| Types of wafers & Substrates acceptable | 6x6mm min, 20x20mm max |
| Data transfer | Excel, txt |
| | Typical Applications | | Measure | Résistivity 10E-4 to 10E7 ohm.cm |
| Measure | Carrier concentration (cm-3) |
| Measure | Carrier mobility (Cm²/Volt-Sec) |
| Characterize | Semiconductor bulk & sheet, Compounds... |
| Semiconductor material for measurement | Si, SiGe, SiC, GaAs, InGaAs, InP, GaN, ITO etc., all of semiconductors can be measured (n/p-type) |
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No detailed Informations
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| HMS3000 |
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