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CM2XX/3XX : Manual/semi-auto "submicronic" "Checkmate" Probers
  4 - PROBING OF MICROSTRUCTURES > A - PROBERS FOR ELECTRICAL ANALYSIS AND CHARACTERIZATION > General purpose probers (design, failure analysis, small production...)
The Checkmate serie represents the state of the art for probing stations, either manual or semi-automatic
» Available for probing on individual die or on wafers up to 8" or 12"
This family of probe stations allows high performance for pads probing or internal lines manually or automatically
» The stations are on-site upgradable from one version to another
» Totally controllable by GPIB (semi-auto version)
» A variety of options & accessories responds to all applications, which cold characterization (-65°C) and femtoamp measurement
It's the ideal tool for design validation, failure analysis, small production testing(with manual loading of the wafer or die)
+ See the full DC range
++ See the RF&Microwave range
 
 
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General information
Max wafer size12"
Typical Applications
Probecards useYes
1st criteria of choice8" or 12", submicronic, High accuracy & repeatability, for characterization & design validation, control "hands off"
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Product DataSheet (pdf)Clic here to download
Options & Accessories
Other options & AccessoriesDETAIL
  
   
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